TEMPERATURE-DEPENDENT RESISTIVITY MEASUREMENTS ON POLYCRYSTALLINE SIO2-COVERED THIN GOLD-FILMS

被引：26

作者：

DEVRIES, JWC

机构：

[1] Philips Research Lab, Eindhoven, Neth, Philips Research Lab, Eindhoven, Neth

来源：

THIN SOLID FILMS | 1987年 / 150卷 / 2-3期

关键词：

D O I：

10.1016/0040-6090(87)90091-5

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：201 / 208

页数：8

共 11 条

[1] The conductivity of thin metallic films according to the electron theory of metals [J].

Fuchs, K .

PROCEEDINGS OF THE CAMBRIDGE PHILOSOPHICAL SOCIETY, 1938, 34 :100-108

[2] ELECTRICAL-RESISTIVITY OF COPPER, GOLD, PALLADIUM, AND SILVER [J].

MATULA, RA .

JOURNAL OF PHYSICAL AND CHEMICAL REFERENCE DATA, 1979, 8 (04) :1147-1298

[3] ELECTRICAL-RESISTIVITY MODEL FOR POLYCRYSTALLINE FILMS - CASE OF ARBITRARY REFLECTION AT EXTERNAL SURFACES [J].

MAYADAS, AF ;

SHATZKES, M .

PHYSICAL REVIEW B, 1970, 1 (04) :1382-&

[4]

MEADEN GI, 1965, ELECTRICAL RESISTANC

[5] THE ELECTRICAL-RESISTIVITY OF GOLD-FILMS [J].

SAMBLES, JR ;

ELSOM, KC ;

JARVIS, DJ .

PHILOSOPHICAL TRANSACTIONS OF THE ROYAL SOCIETY A-MATHEMATICAL PHYSICAL AND ENGINEERING SCIENCES, 1982, 304 (1486) :365-+

[6]

SAMBLES JR, 1983, THIN SOLID FILMS, V106, P321, DOI 10.1016/0040-6090(83)90344-9

[7] STATISTICAL MODEL FOR SIZE EFFECT IN ELECTRICAL CONDUCTION [J].

SOFFER, SB .

JOURNAL OF APPLIED PHYSICS, 1967, 38 (04) :1710-&

[8] THE MEAN FREE PATH OF ELECTRONS IN METALS [J].

SONDHEIMER, EH .

ADVANCES IN PHYSICS, 1952, 1 (01) :1-42

[9]

Tellier C. R., 1982, Size effects in thin films

[10] INFLUENCE OF GRAIN-BOUNDARIES AND SURFACE DEBYE TEMPERATURE ON THE ELECTRICAL-RESISTANCE OF THIN GOLD-FILMS [J].

VANATTEKUM, PMTM ;

WOERLEE, PH ;

VERKADE, GC ;

HOEBEN, AAM .

PHYSICAL REVIEW B, 1984, 29 (02) :645-650

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