ANALYSIS OF THE TRAVELING-WAVE TECHNIQUE FOR MEASURING MOBILITIES IN LOW-CONDUCTIVITY SEMICONDUCTORS

被引：20

作者：

FRITZSCHE, H ^{[1
]}

机构：

[1] UNIV CHICAGO,JAMES FRANCK INST,CHICAGO,IL 60637

来源：

PHYSICAL REVIEW B | 1984年 / 29卷 / 12期

关键词：

D O I：

10.1103/PhysRevB.29.6672

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

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页码：6672 / 6678

页数：7

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共 11 条

[1] ACOUSTOELECTRIC MEASUREMENT OF LOW CARRIER MOBILITIES IN HIGHLY RESISTIVE FILMS
ADLER, R
JANES, D
HUNSINGER, BJ
DATTA, S
[J]. APPLIED PHYSICS LETTERS, 1981, 38 (02) : 102 - 103
[2] Auld B.A., 1973, ACOUSTIC FIELDS WAVE, V2
[3] NORMAL MODES OF CARRIER WAVES IN SEMICONDUCTOR PLATES
BLOTEKJAER, K
[J]. IEEE TRANSACTIONS ON ELECTRON DEVICES, 1970, ED17 (01) : 30 - +
[4] CONDUCTION IN A-SI-H STUDIED BY TRAVELING WAVE TECHNIQUE
CHEN, KJ
FRITZSCHE, H
[J]. JOURNAL OF NON-CRYSTALLINE SOLIDS, 1983, 59-6 (DEC) : 441 - 444
[5] DRIFT-MOBILITY MEASUREMENTS IN AMORPHOUS-SEMICONDUCTORS USING TRAVELING-WAVE METHOD
FRITZSCHE, H
CHEN, KJ
[J]. PHYSICAL REVIEW B, 1983, 28 (08): : 4900 - 4902
[6] LINEAR AND NONLINEAR ATTENUATION OF ACOUSTIC SURFACE WAVES IN A PIEZOELECTRIC COATED WITH A SEMICONDUCTING FILM
INGEBRIGTSEN, KA
[J]. JOURNAL OF APPLIED PHYSICS, 1970, 41 (02) : 454 - +
[7] JANES D, 1981, THESIS U ILLINOIS
[8] JANES D, 1981, TETRAHEDRALLY BONDED
[9] PHOTOCURRENT TRANSIENT SPECTROSCOPY - MEASUREMENT OF THE DENSITY OF LOCALIZED STATES IN ALPHA-AS2SE3
ORENSTEIN, J
KASTNER, M
[J]. PHYSICAL REVIEW LETTERS, 1981, 46 (21) : 1421 - 1424
[10] EVIDENCE FOR EXPONENTIAL BAND TAILS IN AMORPHOUS-SILICON HYDRIDE
TIEDJE, T
CEBULKA, JM
MOREL, DL
ABELES, B
[J]. PHYSICAL REVIEW LETTERS, 1981, 46 (21) : 1425 - 1428