PECULIARITIES OF THE DC CONDUCTIVITY OF THIN AMORPHOUS AS-SE LAYERS AFTER C+ IMPLANTATION

被引:2
作者
BALABANOV, S
SKORDEVA, E
KRASTEV, V
MARINOVA, T
DJAKOV, A
ANGELOV, C
机构
[1] BULGARIAN ACAD SCI,INST GEN & INORGAN CHEM,BU-1784 SOFIA,BULGARIA
[2] BULGARIAN ACAD SCI,INST NUCL RES & NUCL ENERGY,BU-1784 SOFIA,BULGARIA
来源
PHYSICA STATUS SOLIDI A-APPLIED RESEARCH | 1995年 / 151卷 / 01期
关键词
Activation energy - Amorphous films - Argon - Arsenic compounds - Charge carriers - Electric conductivity of solids - Ion implantation - Structure (composition) - X ray photoelectron spectroscopy;
D O I
10.1002/pssa.2211510117
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Thin amorphous As2Se3, As3Se2, and AsSe layers are implanted with C+ at doses of D = 1 x 10(16) to 2 x 10(17) cm(-2). The de conductivity is measured and thermal activation energy is determined. Up to D = 1x10(17) cm(-2) carbon, essential changes are not observed. This is ascribed to gradual formation of nanoclusters of amorphous carbon which do not alter substantially the conductivity. After reaching a dose of implanted carbon of D = 2 x 10(17) cm(-2), chain structures are formed on the basis of carbon nanoclusters. It is assumed that these structures are the reason for a drastic increase in the de conductivity. The transport mechanism of the charge carriers is the characteristic one for chalcogenide thin layers, i.e. hopping conductivity.
引用
收藏
页码:143 / 149
页数:7
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