OVERLAYER GROWTH AND MOLECULAR-STRUCTURES OF C-84 AND OTHER LARGE FULLERENES - A SCANNING-TUNNELING-MICROSCOPY STUDY

被引：31

作者：

LI, YZ ^{[1
]}

PATRIN, JC ^{[1
]}

CHANDER, M ^{[1
]}

WEAVER, JH ^{[1
]}

KIKUCHI, K ^{[1
]}

ACHIBA, Y ^{[1
]}

机构：

[1] TOKYO METROPOLITAN UNIV,FAC SCI,DEPT CHEM,HACHIOJI,TOKYO 19203,JAPAN

来源：

PHYSICAL REVIEW B | 1993年 / 47卷 / 16期

关键词：

D O I：

10.1103/PhysRevB.47.10867

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Thin films of C84, C82, C78, C76, and C70 grown on cleaved GaAs(110) were studied with scanning tunneling microscopy. Well-ordered two-dimensional arrays were formed at submonolayer molecular coverage for each fullerene. High-resolution imaging of C84 revealed intramolecular features that we attribute to atomic features on the fullerene cage. Variations in the symmetry of these structures reflect differences in the molecular orientation. Similar intramolecular features were observed for C82 but none were imaged for C78, C76, and C70, implying that substrate interaction is less restrictive and the fullerenes rotate at 300 K.

引用

页码：10867 / 10872

页数：6

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