CHARACTERIZATION OF GAAS ALXGA1-XAS STRUCTURES USING SCANNING PHOTOLUMINESCENCE

被引：6

作者：

MORETTI, AL

CHAMBERS, FA

DEVANE, GP

KISH, FA

机构：

[1] Amoco Technol Co, Naperville, IL,, USA

来源：

IEEE JOURNAL OF QUANTUM ELECTRONICS | 1989年 / 25卷 / 05期

关键词：

12;

D O I：

10.1109/3.27995

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：1018 / 1024

页数：7

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