CONTACT ELECTRIFICATION USING FORCE MICROSCOPY

被引:449
作者
TERRIS, BD
STERN, JE
RUGAR, D
MAMIN, HJ
机构
关键词
D O I
10.1103/PhysRevLett.63.2669
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
引用
收藏
页码:2669 / 2672
页数:4
相关论文
共 16 条
[1]   ATOMIC FORCE MICROSCOPE [J].
BINNIG, G ;
QUATE, CF ;
GERBER, C .
PHYSICAL REVIEW LETTERS, 1986, 56 (09) :930-933
[2]  
Cross J., 1987, ELECTROSTATICS PRINC
[3]  
Durand E., 1966, ELECTROSTATIQUE, V2, P209
[4]   A CRITIQUE OF CONTACT CHARGE SPECTROSCOPY - A RESPONSE [J].
FABISH, TJ ;
DUKE, CB .
JOURNAL OF APPLIED PHYSICS, 1988, 64 (04) :2218-2221
[5]  
Harper W. R., 1967, CONTACT FRICTIONAL E
[6]   SEPARATING DISCHARGES ON ELECTRIFIED INSULATING SHEET [J].
JI, XG ;
TAKAHASHI, Y ;
KOMAI, Y ;
KOBAYASHI, S .
JOURNAL OF ELECTROSTATICS, 1989, 23 :381-390
[7]   A CRITIQUE OF CONTACT CHARGE SPECTROSCOPY [J].
LOWELL, J ;
ROSEINNES, AC ;
ELKAZZAZ, AM .
JOURNAL OF APPLIED PHYSICS, 1988, 64 (04) :1957-1963
[8]   CONTACT ELECTRIFICATION - WHY IS IT VARIABLE [J].
LOWELL, J ;
AKANDE, AR .
JOURNAL OF PHYSICS D-APPLIED PHYSICS, 1988, 21 (01) :125-137
[9]   CONTACT ELECTRIFICATION [J].
LOWELL, J ;
ROSEINNES, AC .
ADVANCES IN PHYSICS, 1980, 29 (06) :947-1023
[10]   HIGH-RESOLUTION CAPACITANCE MEASUREMENT AND POTENTIOMETRY BY FORCE MICROSCOPY [J].
MARTIN, Y ;
ABRAHAM, DW ;
WICKRAMASINGHE, HK .
APPLIED PHYSICS LETTERS, 1988, 52 (13) :1103-1105