AN ENVELOPE METHOD FOR DETERMINATION OF THE OPTICAL-CONSTANTS OF ABSORPTIVE FILMS ON ABSORPTIVE SUBSTRATES

被引：7

作者：

KUSHEV, DB

ZHELEVA, NN

GYULMEZOV, MI

KOPARANOVA, MH

机构：

[1] Semiconductor Physics and Technology Institute, St. Clement Okhridski University of Sofia

来源：

INFRARED PHYSICS | 1993年 / 34卷 / 02期

关键词：

D O I：

10.1016/0020-0891(93)90005-R

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

A simple variant of the envelope method for deducing optical constants from the interference extrema of the front reflectivity, is extended to the case of an absorbing film on a strongly absorbing substrate. The envelope method is applied to the experimental spectra of SnTe epitaxial layers on metal substrates.

引用

页码：163 / 167

页数：5

共 5 条

[1] ALELES F, 1971, PHYSICS THIN FILMS, V6
[2] A NEW METHOD FOR THE DETERMINATION OF THE THICKNESS, THE OPTICAL-CONSTANTS AND THE RELAXATION-TIME OF WEAKLY ABSORBING SEMICONDUCTING THIN-FILMS
KUSHEV, DB
ZHELEVA, NN
DEMAKOPOULOU, Y
SIAPKAS, D
[J]. INFRARED PHYSICS, 1986, 26 (06): : 385 - 393
[3] SIMPLE METHOD FOR DETERMINATION OF OPTICAL-CONSTANTS N,K AND THICKNESS OF A WEAKLY ABSORBING THIN-FILM
MANIFACIER, JC
GASIOT, J
FILLARD, JP
[J]. JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1976, 9 (11): : 1002 - 1004
[4] MOTULEVICH GP, 1971, T FIAN, V55
[5] OPTICAL-CONSTANTS OF TIN TELLURIDE DETERMINED FROM INFRARED INTERFERENCE SPECTRA
SIAPKAS, D
KUSHEV, DB
ZHELEVA, NN
SIAPKAS, J
LELIDIS, I
[J]. INFRARED PHYSICS, 1991, 31 (05): : 425 - 433

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