SURFACE SENSITIVE MOSSBAUER-SPECTROSCOPY BY THE COMBINATION OF TOTAL EXTERNAL REFLECTION AND CONVERSION ELECTRON DETECTION

被引:27
作者
FROST, JC [1 ]
COWIE, BCC [1 ]
CHAPMAN, SN [1 ]
MARSHALL, JF [1 ]
机构
[1] HERIOT WATT UNIV,DEPT CHEM & PHYS,EDINBURGH EH14 4AS,MIDLOTHIAN,SCOTLAND
关键词
D O I
10.1063/1.96078
中图分类号
O59 [应用物理学];
学科分类号
摘要
引用
收藏
页码:581 / 583
页数:3
相关论文
共 14 条
[1]   MOSSBAUER CONVERSION ELECTRON-SPECTRA AT TOTAL REFLECTION [J].
ANDREEVA, MA ;
KUZMIN, RN .
PHYSICA STATUS SOLIDI B-BASIC RESEARCH, 1984, 125 (02) :461-465
[2]   NUCLEAR ANOMALOUS DISPERSION IN FE57 BY METHOD OF TOTAL REFLECTION [J].
BERNSTEIN, S ;
CAMPBELL, EC .
PHYSICAL REVIEW, 1963, 132 (04) :1625-&
[3]   The total reflexion of X-rays [J].
Compton, AH .
PHILOSOPHICAL MAGAZINE, 1923, 45 (270) :1121-1131
[4]  
GALLAGHER PK, 1976, APPLICATIONS MOSSBAU, V1, P199
[5]   IMPEDANCE-MATCHED GRAZING-INCIDENCE FILMS - PURE NUCLEAR REFLECTIONS, RESONANT FILTERING OF SYNCHROTRON RADIATION, AND X-RAY INTERFEROMETRY [J].
HANNON, JP ;
TRAMMELL, GT ;
MUELLER, M ;
GERDAU, E ;
WINKLER, H ;
RUFFER, R .
PHYSICAL REVIEW LETTERS, 1979, 43 (09) :636-639
[6]   ANALYSIS OF ELECTRON-TRANSPORT IN CONVERSION ELECTRON MOSSBAUER-SPECTROSCOPY (CEMS) [J].
LILJEQUIST, D ;
EKDAHL, T ;
BAVERSTAM, U .
NUCLEAR INSTRUMENTS & METHODS, 1978, 155 (03) :529-538
[7]   INTERPRETATION AND PRACTICAL ANALYSIS OF DEPTH SELECTIVE CONVERSION ELECTRON MOSSBAUER-SPECTRA [J].
LILJEQUIST, D ;
BODLUNDRINGSTROM, B .
NUCLEAR INSTRUMENTS & METHODS, 1979, 160 (01) :131-136
[8]   INFLUENCE OF SURFACE-ROUGHNESS ON THE PROPAGATION OF X-RAYS THROUGH CAPILLARIES [J].
PANTELL, RH ;
CHUNG, PS .
APPLIED OPTICS, 1979, 18 (06) :897-899
[9]   SURFACE STUDIES OF SOLIDS BY TOTAL REFLECTION OF X-RAYS [J].
PARRATT, LG .
PHYSICAL REVIEW, 1954, 95 (02) :359-369
[10]  
POUND RV, 1979, J PHYS, V40, P3