ESTIMATING AND REDUCING ERRORS IN MOS DOSIMETERS CAUSED BY EXPOSURE TO DIFFERENT RADIATIONS

被引：23

作者：

AUGUST, LS

机构：

来源：

IEEE TRANSACTIONS ON NUCLEAR SCIENCE | 1982年 / 29卷 / 06期

关键词：

D O I：

10.1109/TNS.1982.4336486

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：2000 / 2003

页数：4

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