CONTINUOUSLY DISPLAYED EMITTANCE MEASUREMENTS

被引:20
作者
BILLEN, JH [1 ]
机构
[1] UNIV WISCONSIN,MADISON,WI 53706
关键词
D O I
10.1063/1.1134040
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
引用
收藏
页码:33 / 40
页数:8
相关论文
共 12 条
[1]  
Banford AP., 1966, TRANSPORT CHARGED PA
[2]   MAGNETIC AND ELECTROSTATIC DEFLECTORS FOR CHARGED-PARTICLE BEAMS [J].
HAEBERLI, W .
REVIEW OF SCIENTIFIC INSTRUMENTS, 1973, 44 (03) :342-343
[3]  
KLODY GM, 1972, B AM PHYS SOC, V17, P510
[4]   DIRECT EXTRACTION OF NEGATIVE ION BEAMS OF GOOD INTENSITY FROM A DUOPLASMATRON [J].
LAWRENCE, GP ;
BEAUCHAMP, RK ;
MCKIBBEN, JL .
NUCLEAR INSTRUMENTS & METHODS, 1965, 32 (02) :357-+
[5]  
LICHTENBERG AJ, 1969, PHASE SPACE DYNAMICS
[6]   EMITTANCE MEASUREMENT OF MAGNETRON ION SOURCE [J].
MARSICANIN, BS .
NUCLEAR INSTRUMENTS & METHODS, 1969, 75 (01) :106-+
[7]  
PREVOT F, 1972, 2 P INT C ION SOURC, P146
[8]  
RICHARDS HT, 1972, 2 P INT C ION SOURC, P804
[9]  
RICHARDS HT, 1971, BNL50310 BROOKH NAT, P295
[10]  
SLUYTERS TJM, 1967, IEEE T NUCL SCI, VNS14, P1143