PERFORMANCE-MEASUREMENTS OF A 1-KEV ELECTRON-BEAM MICROCOLUMN

被引:18
作者
MURAY, LP
STAUFER, U
KERN, DP
CHANG, THP
机构
来源
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B | 1992年 / 10卷 / 06期
关键词
D O I
10.1116/1.585995
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
A complete 1-keV electron-beam microcolumn, measuring only 2.5 mm in length, has been assembled and tested. The microcolumn combines a scanning tunneling microscope aligned field-emission source with a miniaturized octupole scanner and a microfabricated einzel lens. Expected performance of this configuration, at a working distance of 1 mm and semiconvergent angle of 2.5 mrad, has been calculated to be a probe size of 8 nm with current density exceeding 10(4) A/cm2. The microcolumn has been successfully operated at 1 keV in scanning transmission mode using a 1-mum grid sample. Images were acquired with scan fields ranging from 10 to 100 mum and preliminary resolution measurements indicated Gaussian beam diameter of 200 nm. Significant improvements are expected in the near term.
引用
收藏
页码:2749 / 2753
页数:5
相关论文
共 8 条
  • [1] MICROMINIATURIZATION OF ELECTRON-OPTICAL SYSTEMS
    CHANG, THP
    KERN, DP
    MURAY, LP
    [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1990, 8 (06): : 1698 - 1705
  • [2] FEINERMAN AD, 1991, 180TH P ECS C PHOEN
  • [3] SCANNING TUNNELING MICROSCOPE MICROLENS WITH MAGNETIC FOCUSING
    HORDON, LS
    PEASE, RFW
    [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1990, 8 (06): : 1686 - 1690
  • [4] MCCORD MA, 1989, J VAC SCI TECHNOL B, V6, P1851
  • [5] EXPERIMENTAL EVALUATION OF A SCANNING TUNNELING MICROSCOPE-MICROLENS SYSTEM
    MURAY, LP
    STAUFER, U
    BASSOUS, E
    KERN, DP
    CHANG, THP
    [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1991, 9 (06): : 2955 - 2961
  • [6] PHYSICAL-PROPERTIES OF THIN-FILM FIELD-EMISSION CATHODES WITH MOLYBDENUM CONES
    SPINDT, CA
    BRODIE, I
    HUMPHREY, L
    WESTERBERG, ER
    [J]. JOURNAL OF APPLIED PHYSICS, 1976, 47 (12) : 5248 - 5263
  • [7] INVESTIGATION OF EMITTER TIPS FOR SCANNING TUNNELING MICROSCOPE-BASED MICROPROBE SYSTEMS
    STAUFER, U
    MURAY, LP
    KERN, DP
    CHANG, THP
    [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1991, 9 (06): : 2962 - 2966
  • [8] YAO JJ, 1991, NANOSTRUCTURE MESOSC