CHARGED-PARTICLE RAY SIMULATOR AND MONITOR

被引：7

作者：

KISKER, E

机构：

来源：

REVIEW OF SCIENTIFIC INSTRUMENTS | 1983年 / 54卷 / 09期

关键词：

D O I：

10.1063/1.1137533

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：1113 / 1116

页数：4

共 10 条

[1] Calculation of axially symmetric fields [J].

Bertram, S .

JOURNAL OF APPLIED PHYSICS, 1942, 13 (08) :496-502

[2] NATURE OF THE RESONANT 6-EV SATELLITE IN NI - PHOTOELECTRON SPIN-POLARIZATION ANALYSIS [J].

CLAUBERG, R ;

GUDAT, W ;

KISKER, E ;

KUHLMANN, E ;

ROTHBERG, GM .

PHYSICAL REVIEW LETTERS, 1981, 47 (18) :1314-1317

[3] A METHOD FOR RAPID CALCULATIONS OF ELECTRON TRAJECTORIES IN MULTI-ELEMENT ELECTROSTATIC CYLINDER LENSES [J].

FINK, J ;

KISKER, E .

REVIEW OF SCIENTIFIC INSTRUMENTS, 1980, 51 (07) :918-920

[4]

Glaser W., 1952, GRUNDLAGEN ELEKTRONE

[5]

HEDDLE DWO, 1982, J PHYS E SCI INSTRUM, V15, P1210, DOI 10.1088/0022-3735/15/11/019

[6]

HERRMANNSFELD WB, 1973, SLAC166A REP, pUC28

[7] EVIDENCE FOR A NEW BROADENING MECHANISM IN ANGLE-RESOLVED PHOTOEMISSION FROM CU(111) [J].

KEVAN, SD .

PHYSICAL REVIEW LETTERS, 1983, 50 (07) :526-529

[8] SIMPLE METHOD FOR ACCURATE RAY TRACING IN ELECTROSTATIC LENSES [J].

KISKER, E .

REVIEW OF SCIENTIFIC INSTRUMENTS, 1982, 53 (01) :114-116

[9] PRECISION REGULATOR FOR ANNEALING OF POLARIZED-ELECTRON FIELD EMITTERS AND MULTIPLE MULTICHANNEL ANALYZER BASED ON A MICROPROCESSOR BOARD [J].

KISKER, E .

JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1978, 11 (07) :697-701

[10]

Kunz K. S., 1957, NUMERICAL ANAL

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