CHARACTERIZATION OF THE MICROSTRUCTURE OF CERAMICS USED IN MULTILAYER CERAMIC CAPACITORS BY MEANS OF THE SCANNING LASER ACOUSTIC MICROSCOPE

被引:5
作者
KESSLER, LW
SEMMENS, JE
机构
关键词
D O I
10.1111/j.1151-2916.1989.tb06072.x
中图分类号
TQ174 [陶瓷工业]; TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
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页码:2271 / 2275
页数:5
相关论文
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[2]  
KESSLER LW, 1988, 1988 P IEEE ULTR S C, P725
[3]  
KESSLER LW, 1989, MAR P CAP RES TECHN, P63
[4]  
Krautkramer J, 1983, ULTRASONIC TESTING M
[5]   ACOUSTIC MICROSCOPY OF CERAMIC CAPACITORS [J].
LOVE, GR ;
EWELL, GJ .
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[6]  
NONDESTRUCTIVE TESTI