FAR-INFRARED BAND AND CHARACTERIZATION MEASUREMENTS IN THE HGTE-CDTE SUPERLATTICE

被引：8

作者：

KIM, LS

PERKOWITZ, S

WU, OK

SCHULMAN, JN

机构：

[1] Dept of Phys., Emory Univ., Atlanta, GA

来源：

SEMICONDUCTOR SCIENCE AND TECHNOLOGY | 1990年 / 5卷

关键词：

D O I：

10.1088/0268-1242/5/3S/023

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Far-infrared (10-250 cm-1) reflectivity measurements have been made on three MBE-grown HgTe-CdTe superlattices. Analysis of plasmon effects with a superlattice dielectric function gives the effective mass parallel to the superlattice planes. The low-temperature masses are near those of the Hg 1-xCdxTe alloy with the same energy gap, suggesting that the superlattice conduction band is like that of the alloy. Comparison of the effective mass values with those calculated from the multiband tight-binding model gives a valence band offset near 350 meV. The infrared data also give accurate values of the layer thickness and composition.

引用

页码：S107 / S110

页数：4

共 30 条

[1]

Schulman JN, McGill TC, Appl. Phys. Lett., 34, 10, pp. 663-665, (1979)

[2]

Schulman JN, McGill TC, Phys. Rev., 23, 8, pp. 4149-4155, (1981)

[3]

Smith DL, McGill TC, Schulman JN, Appl. Phys. Lett., 43, 2, pp. 180-182, (1983)

[4]

Guldner Y, Bastard G, Vierren JP, Voos M, Faurie JP, Million A, Phys. Rev. Lett., 51, 10, pp. 907-910, (1983)

[5]

Baukus JP, Hunter AT, Schulman JN, Faurie JP, J. Appl. Phys., 64, 1, pp. 283-286, (1988)

[6]

Kowalczyk SP, Cheung JT, Kraut EA, Grant RW, Phys. Rev. Lett., 56, 15, pp. 1605-1608, (1986)

[7]

Duc TM, Hsu C, Faurie JP, Phys. Rev. Lett., 58, 11, pp. 1127-1130, (1987)

[8]

Shih CK, Spicer WE, Phys. Rev. Lett., 58, 24, pp. 2594-2597, (1987)

[9]

Bastard G, Phys. Rev., 25, 12, pp. 7584-7597, (1982)

[10]

Ong NP, Kote G, Cheung JT, Phys. Rev., 28, 4, pp. 2289-2291, (1983)

← 1 2 3 →