CAVITY FOR MICROWAVE-INDUCED PLASMAS OPERATED IN HELIUM AND ARGON AT ATMOSPHERIC-PRESSURE

被引:427
作者
BEENAKKER, CIM [1 ]
机构
[1] PHILIPS RES LABS,EINDHOVEN,NETHERLANDS
关键词
D O I
10.1016/0584-8547(76)80047-X
中图分类号
O433 [光谱学];
学科分类号
0703 ; 070302 ;
摘要
引用
收藏
页码:483 / 486
页数:4
相关论文
共 12 条
[1]   SELECTIVE EMISSION SPECTROMETRIC DETERMINATION OF NANOGRAM QUANTITIES OF ORGANIC BROMINE CHLORINE IODINE PHOSPHORUS AND SULFUR COMPOUNDS IN A HELIUM PLASMA [J].
BACHE, CA ;
LISK, DJ .
ANALYTICAL CHEMISTRY, 1967, 39 (07) :786-&
[2]   USE OF MICROWAVE-EXCITED EMISSIVE DETECTOR FOR GAS-CHROMATOGRAPHY FOR QUANTITATIVE MEASUREMENT OF INTER-ELEMENT RATIOS [J].
DAGNALL, RM ;
WHITEHEA.P ;
WEST, TS .
ANALYTICAL CHEMISTRY, 1972, 44 (12) :2074-&
[3]   SIMPLE ATMOSPHERIC MICROWAVE-EXCITED EMISSIVE DETECTOR FOR GAS-CHROMATOGRAPHY [J].
DAGNALL, RM ;
WEST, TS ;
WHITEHEA.P .
ANALYTICA CHIMICA ACTA, 1972, 60 (01) :25-&
[4]   PHYSICAL AND ANALYTICAL ASPECTS OF A MICROWAVE EXCITED PLASMA [J].
FALLGATTER, K ;
SVOBODA, V ;
WINEFORDNER, JD .
APPLIED SPECTROSCOPY, 1971, 25 (03) :347-+
[5]   MICROWAVE DISCHARGE CAVITIES OPERATING AT 2450 MHZ [J].
FEHSENFELD, FC ;
EVENSON, KM ;
BROIDA, HP .
REVIEW OF SCIENTIFIC INSTRUMENTS, 1965, 36 (03) :294-+
[6]   TALANTA REVIEW - PLASMA EMISSION SOURCES IN ANALYTICAL SPECTROSCOPY .2. [J].
GREENFIELD, S ;
MCGEACHIN, HM ;
SMITH, PB .
TALANTA, 1975, 22 (07) :553-562
[7]   A SIMPLE LOW-POWER REDUCED-PRESSURE MICROWAVE PLASMA SOURCE FOR EMISSION SPECTROSCOPY [J].
HINGLE, DN ;
KIRKBRIGHT, GF ;
BAILEY, RM .
TALANTA, 1969, 16 (08) :1223-+
[8]   IMPROVED PNEUMATIC NEBULIZER FOR USE AT LOW NEBULIZING GAS-FLOWS [J].
KNISELEY, RN ;
AMENSON, H ;
BUTLER, CC ;
FASSEL, VA .
APPLIED SPECTROSCOPY, 1974, 28 (03) :285-286
[9]  
LICHTE FE, 1973, ANAL CHEM, V45, P399
[10]   SENSITIVE SELECTIVE GAS CHROMATOGRAPHY DETECTOR BASED ON EMISSION SPECTROMETRY OF ORGANIC COMPOUNDS [J].
MCCORMACK, AJ ;
TONG, SC ;
COOKE, WD .
ANALYTICAL CHEMISTRY, 1965, 37 (12) :1470-+