QUANTITATIVE-ANALYSIS OF LIGHT-ELEMENTS IN A HEAVY MATERIAL BY HIGH-ENERGY ION RECOIL (HEIR) SPECTROMETRY

被引：18

作者：

MOREAU, C

KNYSTAUTAS, EJ

TIMSIT, RS

GROLEAU, R

机构：

[1] ALCAN INT LTD,KINGSTON LABS,KINGSTON K7L 4Z4,ONTARIO,CANADA

[2] UNIV MONTREAL,PHYS NUCL LAB,MONTREAL H3C 3T4,QUEBEC,CANADA

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH | 1983年 / 218卷 / 1-3期

关键词：

D O I：

10.1016/0167-5087(83)90964-X

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：111 / 115

页数：5

共 11 条

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[2]

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[7]

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[8] PULSE-HEIGHT RESPONSE CHARACTERISTICS FOR HEAVY-IONS IN SILICON SURFACE-BARRIER DETECTORS [J].

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GROSS, CE ;

KAUFMAN, SB .

NUCLEAR INSTRUMENTS & METHODS, 1972, 99 (02) :309-+

[9] DEPTH PROFILING OF LIGHT-ELEMENTS IN MATERIALS WITH HIGH-ENERGY ION-BEAMS [J].

TERREAULT, B ;

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LECUYER, J .

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[10]

TIMSIT RS, 1982, KR82159S ALC INT LTD

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