SCANNING FORCE MICROSCOPY ON SILVER ISLAND FILMS - CORRELATION BETWEEN PARTICLE GEOMETRY AND OPTICAL-PROPERTIES

被引：19

作者：

SCHIMMEL, T

BINGLER, HG

FRANZKE, D

WOKAUN, A

机构：

[1] Universität Bayreuth, Bayreuth

[2] Universität Bayreuth, Bayreuth

[3] Laboratorium Für Physikalische Chemi, Zürich, CH-8092, ETH Zentrum

来源：

ADVANCED MATERIALS | 1994年 / 6卷 / 04期

关键词：

D O I：

10.1002/adma.19940060411

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

The behavior of metal island films needs to be studied if such films are to be used, as envisaged, in optical data communication and sensor technologies. The changes in surface topography of Ag island films on glass substrates upon thermal annealing (see Figure) and laser irradiation, as revealed by atomic force microscopy, are reported and correlated with the results of optical absorption supectrometry. (Figure Presented.) Copyright © 1994 Verlag GmbH & Co. KGaA, Weinheim

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页码：303 / 307

页数：5

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