ATOMIC NUMBER DEPENDENCE OF X-RAY CONTINUUM INTENSITY AND PRACTICAL CALCULATION OF BACKGROUND IN ENERGY DISPERSIVE ELECTRON-MICROPROBE ANALYSIS

被引：43

作者：

SMITH, DGW ^{[1
]}

GOLD, CM ^{[1
]}

TOMLINSON, DA ^{[1
]}

机构：

[1] UNIV ALBERTA,DEPT GEOL,EDMONTON T6G 2E3,ALBERTA,CANADA

来源：

关键词：

D O I：

10.1002/xrs.1300040311

中图分类号：

O433 [光谱学];

学科分类号：

0703 ; 070302 ;

摘要：

引用

页码：149 / 156

页数：8

共 13 条

[1]

[Anonymous], ELECT MICROPROBE

[2]

BEAMAN DR, 1973, 8TH P NAT C EPA NEW, P73

[3]

DUNCUMB P, 1968, NBS SPEC PUBL, P133

[4]

FRAZER JZ, 1967, 6729 U CAL I STUD MA

[5]

Kelly T.K., 1966, T I MIN METALL, V75, pB59

Kramers, HA .

PHILOSOPHICAL MAGAZINE, 1923, 46 (275) :836-871

[7]

LIFSHIN E, 1974, 9TH P ANN C EL MICR

[8]

Philibert J., 1963, 3 INT C XRAY OPT MIC, P379

[9]

RAO TSS, 1972, 6TH P INT C XRAY OPT, P131

REED, SJB ;

WARE, NG .

JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1972, 5 (06) :582-&