DIRECT MEASUREMENT OF THE CARRIER LEAKAGE OUT OF THE ACTIVE-REGION IN INGAASP/INP LASER HETEROSTRUCTURES

被引:21
作者
BELENKY, GL
KAZARINOV, RF
LOPATA, J
LURYI, S
TANBUNELK, T
GARBINSKI, PA
机构
关键词
D O I
10.1109/16.370077
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Leakage of electrons out of the active region of InGaAsP/InP laser heterostructures at different temperatures was measured by a purely electrical method. Comparison of the obtained results with the results of modeling indicates that special attention should be paid to the acceptor doping levels in the p cladding layer immediately adjacent the active region. Lower acceptor concentration may lead to unacceptably high thermionic leakage.
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页码:215 / 218
页数:4
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