GROWTH AND CHARACTERIZATION OF MOLYBDENUM DICHALCOGENIDE THIN-FILMS

被引：13

作者：

BERNEDE, JC ^{[1
]}

MANAI, N ^{[1
]}

KETTAF, M ^{[1
]}

SPIESSER, M ^{[1
]}

GOUREAUX, G ^{[1
]}

机构：

[1] IPCM,PHYS CRISTALLINE LAB,CNRS,UM 110,F-44072 NANTES 3,FRANCE

来源：

REVUE DE PHYSIQUE APPLIQUEE | 1990年 / 25卷 / 04期

关键词：

D O I：

10.1051/rphysap:01990002504033900

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：339 / 346

页数：8

共 13 条

[1] FRICTION PROPERTIES OF SPUTTERED DICHALCOGENIDE LAYERS [J].

BERGMANN, E ;

MELET, G ;

MULLER, C ;

SIMONVERMOT, A .

TRIBOLOGY INTERNATIONAL, 1981, 14 (06) :329-332

[2] RESISTIVITY OF POLYCRYSTALLINE THIN-FILMS OF MOSE2 [J].

BERNEDE, JC ;

MALLOUKY, A ;

POUZET, J .

PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1989, 111 (01) :181-191

[3]

BERNEDE JC, 1988, J MATER CHEM PHYS, V20, P571

[4] ELECTRICAL AND OPTICAL-PROPERTIES OF MOSE2 FILMS PREPARED BY RF MAGNETRON SPUTTERING [J].

BICHSEL, R ;

LEVY, F .

THIN SOLID FILMS, 1985, 124 (01) :75-83

[5]

BONNET A, 1986, THESIS NANTES

[6] LOW-ENERGY ABSORPTION-EDGE IN 2H-MOS2 AND 2H-MOSE2 [J].

GOLDBERG, AM ;

BEAL, AR ;

LEVY, FA ;

DAVIS, EA .

PHILOSOPHICAL MAGAZINE, 1975, 32 (02) :367-378

[7] GROWTH OF VACUUM-DEPOSITED TELLURIUM-FILMS ON GLASS SUBSTRATES AND SOME OF THEIR TRANSPORT PROPERTIES [J].

JANDA, M ;

KUBOVY, A .

PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE, 1976, 35 (01) :391-402

[8]

Kaeble E.F., 1967, HDB XRAYS

[9]

KETTAF M, IN PRESS J PHYS CHEM

[10] DEGRADATION OF THIN TELLURIUM-FILMS [J].

LEE, WY ;

GEISS, RH .

JOURNAL OF APPLIED PHYSICS, 1983, 54 (03) :1351-1357

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