INSITU AES CHARACTERIZATION OF ROTATING ELECTRICAL CONTACTS

被引：5

作者：

SINGH, B

VOOK, RW

机构：

来源：

IEEE TRANSACTIONS ON COMPONENTS HYBRIDS AND MANUFACTURING TECHNOLOGY | 1981年 / 4卷 / 01期

关键词：

D O I：

10.1109/TCHMT.1981.1135786

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：36 / 40

页数：5

共 13 条

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[2]

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IEEE TRANSACTIONS ON PARTS HYBRIDS AND PACKAGING, 1973, PHP9 (01) :58-64

[4]

Johnson J. L., 1979, Electrical Contacts 1979. Proceedings of the Twenty-Fifth Anniversary Meeting of the Holm Conference on Electrical Contacts, P129

[5]

KELLER DV, 1971, J VAC SCI TECHNOL, V9, P133

[6]

McNab I. R., 1979, Electrical Contacts 1979. Proceedings of the Twenty-Fifth Anniversary Meeting of the Holm Conference on Electrical Contacts, P159

[7]

PALMBERG PW, 1972, HDB AUGER ELECTRON S

[8]

Reichner P., 1979, Electrical Contacts 1979. Proceedings of the Twenty-Fifth Anniversary Meeting of the Holm Conference on Electrical Contacts, P191

[9]

Schreurs J., 1979, Electrical Contacts 1979. Proceedings of the Twenty-Fifth Anniversary Meeting of the Holm Conference on Electrical Contacts, P145

[10] AES STUDY OF SULFUR SURFACE SEGREGATION ON POLYCRYSTALLINE COPPER [J].

SINGH, B ;

VOOK, RW ;

KNABBE, EA .

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1980, 17 (01) :29-33

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