X-RAY CHARACTERIZATION OF CDTE CRYSTALS WITH NATURAL FACES

被引：7

作者：

AULEYTNER, J

MAJEWSKI, J

FURMANIK, Z

GOLACKI, Z

机构：

[1] Institute of Physics, Polish Academy of Sciences, Warsaw, 02-668

来源：

CRYSTAL RESEARCH AND TECHNOLOGY | 1990年 / 25卷 / 08期

关键词：

D O I：

10.1002/crat.2170250822

中图分类号：

O7 [晶体学];

学科分类号：

0702 ; 070205 ; 0703 ; 080501 ;

摘要：

The exact characterization of natural crystal faces is very important from the point of view of the proper conditions of crystal growth and of the choice of an appropriate substrate for obtaining epitaxial layers. In this work various X‐ray diffraction methods were used to obtain the maximum information about the CdTe crystal surface structure. Applied X‐ray techniques allowed to detect the number of defects even on the natural mirror‐like faces of the crystal which can be treated as a seemingly perfect one. Copyright © 1990 WILEY‐VCH Verlag GmbH & Co. KGaA

引用

页码：971 / 976

页数：6

共 6 条

[1] A COMBINATION OF OSCILLATING SLIT AND OSCILLATING FILM TECHNIQUES FOR THE INVESTIGATION OF LATTICE-DEFECTS [J].