MULTILAYER COATED REFLECTIVE OPTICS FOR EXTREME UV LITHOGRAPHY

被引:24
作者
LOUIS, E
VOORMA, HJ
KOSTER, NB
BIJKERK, F
PLATONOV, YY
ZUEV, SY
ANDREEV, SS
SHAMOV, EA
SALASHCHENKO, NN
机构
[1] FOM-Institute for Plasma Physics Rijnhuizen, 3430 BE Nieuwegein
[2] Institute of Physics of Microstructures, Nizhny Novgorod, 603600
关键词
Number:; -; Acronym:; NWO; Sponsor: Nederlandse Organisatie voor Wetenschappelijk Onderzoek;
D O I
10.1016/0167-9317(94)00096-D
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
In this paper we present normal incidence reflectivity measurements of EUV reflective multilayer coatings for lambda = 13-14 nm, the wavelength of interest for EUV projection lithography. The multilayer coatings are produced by e-beam evaporation in combination with ion-bombardment of the layers and by magnetron sputtering. These techniques are used for coating the mirrors of our Schwarzschild telescope. We show measurements of absolute EUV reflectivity and homogeneity of the layer thickness over the mirrors. Furthermore we discuss the matching of the centre wavelength of the reflectivity curves for each of the components of our projection system.
引用
收藏
页码:235 / 238
页数:4
相关论文
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