MICROWAVE MEASUREMENT OF TEMPERATURE-COEFFICIENT OF PERMITTIVITY FOR SAPPHIRE AND ALUMINA

被引:15
作者
AITKEN, JE [1 ]
LADBROOKE, PH [1 ]
POTOK, MHN [1 ]
机构
[1] ROY MIL COLL SCI,ELECTR BRANCH,SWINDON SN6 8LA,WILTSHIRE,ENGLAND
关键词
D O I
10.1109/TMTT.1975.1128616
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
引用
收藏
页码:526 / 529
页数:4
相关论文
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ENGLAND, EH .
IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, 1973, MT21 (08) :560-562
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[5]   ANISOTROPY IN ALUMINA SUBSTRATES FOR MICROSTRIP CIRCUITS [J].
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IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, 1972, MT20 (11) :775-+
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WEAST RC, 1970, HDB CHEMISTRY PHYSIC