BOUND MULTIEXCITON LUMINESCENCE IN BORON-DOPED SILICON - EXCITATION-LEVEL DEPENDENCE AND RECOMBINATION KINETICS

被引:11
作者
NAKAYAMA, H
OHNISHI, K
SAWADA, H
NISHINO, T
HAMAKAWA, Y
机构
[1] Faculty of Engineering Science, Osaka University, Toyonaka
关键词
D O I
10.1143/JPSJ.46.553
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
Low-temperature luminescence associated with bound multiexciton complexes in boron-doped silicon has been investigated with emphasis on the excitation-level dependence of the luminescence spectra. In order to interpret the experimental results, we have proposed a model for the formation and decay processes of bound multiexciton complexes. It has been found that the excitation-level dependence of the bound multiexciton luminescence in boron-doped silicon is consistent with the excitation behavior calculated from the rate equations based on the model for the recombination kinetics of bound multiexciton complexes. © 1979, THE PHYSICAL SOCIETY OF JAPAN. All rights reserved.
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页码:553 / 560
页数:8
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