GONIOMETER FOR ELECTRON-MICROSCOPY AT 1.6 A POINT-TO-POINT RESOLUTION

[1] ELECTRON-OPTICAL IMAGING OF HOLLANDITE STRUCTURE AT 3 A RESOLUTION [J]. ACTA CRYSTALLOGRAPHICA SECTION A, 1977, 33 (JUL1): : 672 - 676

[2] BURSILL LA, 1978, DIAMOND RES, P11

[3] BURSILL LA, PHILOS MAG

[4] BURSILL LA, 1977, JEOL NEWS E, V15, P5

[5] FOURIER IMAGES .1. THE POINT SOURCE [J]. PROCEEDINGS OF THE PHYSICAL SOCIETY OF LONDON SECTION B, 1957, 70 (05): : 486 - +

[6] APPROXIMATIONS FOR CALCULATION OF HIGH-RESOLUTION ELECTRON-MICROSCOPE IMAGES OF THIN-FILMS [J]. ACTA CRYSTALLOGRAPHICA SECTION A, 1977, 33 (JAN1): : 109 - &

[7] NUMERICAL EVALUATION OF N-BEAM WAVE-FUNCTIONS IN ELECTRON-SCATTERING BY MULTI-SLICE METHOD [J]. ACTA CRYSTALLOGRAPHICA SECTION A, 1974, A 30 (MAR): : 280 - 290

[8] MACLAGEN DS, 1977, PHILOS MAG, V35, P357

[9] MACLAGEN DS, 1975, THESIS U MELBOURNE

[10] MULTIPURPOSE HIGH RESOLUTION STAGE FOR ELECTRON MICROSCOPE [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1968, 39 (07) : 962 - &

[1] ELECTRON-OPTICAL IMAGING OF HOLLANDITE STRUCTURE AT 3 A RESOLUTION [J]. ACTA CRYSTALLOGRAPHICA SECTION A, 1977, 33 (JUL1): : 672 - 676

[2] BURSILL LA, 1978, DIAMOND RES, P11

[3] BURSILL LA, PHILOS MAG

[4] BURSILL LA, 1977, JEOL NEWS E, V15, P5

[5] FOURIER IMAGES .1. THE POINT SOURCE [J]. PROCEEDINGS OF THE PHYSICAL SOCIETY OF LONDON SECTION B, 1957, 70 (05): : 486 - +

[6] APPROXIMATIONS FOR CALCULATION OF HIGH-RESOLUTION ELECTRON-MICROSCOPE IMAGES OF THIN-FILMS [J]. ACTA CRYSTALLOGRAPHICA SECTION A, 1977, 33 (JAN1): : 109 - &

[7] NUMERICAL EVALUATION OF N-BEAM WAVE-FUNCTIONS IN ELECTRON-SCATTERING BY MULTI-SLICE METHOD [J]. ACTA CRYSTALLOGRAPHICA SECTION A, 1974, A 30 (MAR): : 280 - 290

[8] MACLAGEN DS, 1977, PHILOS MAG, V35, P357

[9] MACLAGEN DS, 1975, THESIS U MELBOURNE

[10] MULTIPURPOSE HIGH RESOLUTION STAGE FOR ELECTRON MICROSCOPE [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1968, 39 (07) : 962 - &