A THEORETICAL GROWTH CURVE OF DEFECT FORMATION FOR ELECTRON-SPIN-RESONANCE AND THERMOLUMINESCENCE DATING

被引:9
作者
IKEYA, M
机构
[1] Department of Earth and Space Science, Osaka University, Toyonaka, Osaka
来源
JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS & EXPRESS LETTERS | 1992年 / 31卷 / 11B期
关键词
ESR; TL; DATING; DOSIMETRY; DEFECT; FORMATION; ANNEALING; GROWTH CURVE; 2ND ORDER;
D O I
10.1143/JJAP.31.L1618
中图分类号
O59 [应用物理学];
学科分类号
摘要
A new method for evaluating the total dose of natural radiation (TD) directly from the theoretical growth curve of defect formation is proposed for dating and dosimetry with electron spin resonance (ESR) or thermoluminescence (TL). The defect production efficiency, a, and the insensitive volume around a defect, b, are evaluated from the growth curve by means of an additive dose at a high dose rate D' in the laboratory. The real TD is obtained from the growth curve calculated by solving the equation dn/dt = aD(1 - bn/N0) - n/tau-lambdan2, where D is a natural dose rate, and tau and lambda are the parameters for the first- and second-order annealing.
引用
收藏
页码:L1618 / L1620
页数:3
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