共 3 条
[1]
[Anonymous], 1970, MULTIPLE BEAM INTERF
[2]
GJOSTEIN NA, 1958, THESIS CARNEGIE I TE
[3]
MEASURING SURFACE VARIATIONS WITH SCANNING ELECTRON MICROSCOPE USING DEPOSITED CONTAMINATION LINES
[J].
JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS,
1971, 4 (10)
:747-&