MEASUREMENT OF DIHEDRAL ANGLES BY SCANNING ELECTRON-MICROSCOPY

被引:10
作者
ACHUTARAMAYYA, G [1 ]
SCOTT, WD [1 ]
机构
[1] UNIV WASHINGTON, DEPT MIN MET & CERAMIC ENGN, SEATTLE, WA 98195 USA
关键词
D O I
10.1111/j.1151-2916.1973.tb12472.x
中图分类号
TQ174 [陶瓷工业]; TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
引用
收藏
页码:230 / 231
页数:2
相关论文
共 3 条
[1]  
[Anonymous], 1970, MULTIPLE BEAM INTERF
[2]  
GJOSTEIN NA, 1958, THESIS CARNEGIE I TE
[3]   MEASURING SURFACE VARIATIONS WITH SCANNING ELECTRON MICROSCOPE USING DEPOSITED CONTAMINATION LINES [J].
HOOVER, RA .
JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1971, 4 (10) :747-&