INTERFACE STABILITY AS A MEASURE OF MATERIAL PURITY

被引:1
作者
FISHER, DJ
KURZ, W
机构
关键词
D O I
10.1016/0022-0248(80)90084-6
中图分类号
O7 [晶体学];
学科分类号
0702 ; 070205 ; 0703 ; 080501 ;
摘要
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页码:204 / 206
页数:3
相关论文
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