DEPENDENCE OF LOSS ON DOMAIN-WALL SPACING IN POLYCRYSTALLINE MATERIAL

被引:16
作者
SHARP, MRG [1 ]
PHILLIPS, R [1 ]
OVERSHOT.KJ [1 ]
机构
[1] UNIV WALES,WOLFSON CTR TECHNOL SOFT MAGNETIC MAT,INST SCI & TECHNOL,DEPT ELECT ENGN,CARDIFF CF2 3AD,WALES
来源
PROCEEDINGS OF THE INSTITUTION OF ELECTRICAL ENGINEERS-LONDON | 1973年 / 120卷 / 07期
关键词
D O I
10.1049/piee.1973.0182
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Measurements of total power loss and domain-wall spacing have been made on individual grains in polycrystalline specimens of commercial grain-oriented 3% silicon-iron material. The loss per cycle versus frequency characteristic of a grain is found to consist of discrete linear portions, as distinct from the continuous function that has often been reported. These linear portions re found to correspond to different domain configurations. The loss per cycle is shown to be proportional to the domain-wall spacing, which is observed to decrease with increasing frequency.
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页码:822 / 824
页数:3
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