HIGH-INTENSITY TRANSMISSION X-RAY TOPOGRAPHY OF HOMOGENEOUSLY BENT CRYSTALS

被引：34

作者：

MEIERAN, ES

BLECH, IA

机构：

来源：

JOURNAL OF APPLIED PHYSICS | 1972年 / 43卷 / 02期

关键词：

D O I：

10.1063/1.1661104

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：265 / &

共 17 条

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