EVALUATION OF THE MINORITY-CARRIER DIFFUSION LENGTH BY MEANS OF ELECTRON-BEAM-INDUCED CURRENT AND MONTE-CARLO SIMULATION IN ALGAAS AND GAAS P-I-N SOLAR-CELLS

被引:12
作者
GRUNBAUM, E
NAPCHAN, E
BARKAY, Z
BARNHAM, K
NELSON, J
FOXON, CT
ROBERTS, JS
HOLT, DB
机构
[1] TEL AVIV UNIV, FAC ENGN, DEPT PHYS ELECTR, IL-69978 RAMAT AVIV, ISRAEL
[2] UNIV LONDON IMPERIAL COLL SCI TECHNOL & MED, DEPT MAT, LONDON SW7 2BZ, ENGLAND
[3] TEL AVIV UNIV, SCH PHYS & ASTRON, IL-69978 RAMAT AVIV, ISRAEL
[4] UNIV LONDON IMPERIAL COLL SCI TECHNOL & MED, BLACKETT LAB, LONDON SW7 2BZ, ENGLAND
[5] UNIV NOTTINGHAM, DEPT PHYS, NOTTINGHAM NG7 2RD, ENGLAND
[6] UNIV SHEFFIELD, SERC, FAC 3 5, SHEFFIELD S1 3JD, S YORKSHIRE, ENGLAND
关键词
D O I
10.1088/0268-1242/10/5/010
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
A new method of determining the minority carrier diffusion length in multilayer solar cells is described. Electron beam-induced current (EBIC) gain measurements, performed in a scanning electron microscope in the planar sample configuration, are compared with values obtained by calculations using a Monte Carlo simulation program of electron trajectories. Values for diffusion lengths obtained by this method from five AlGaAs and GaAs p-i-n and p-n solar cells are compared with values given in the literature.
引用
收藏
页码:627 / 633
页数:7
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