SCANNING TUNNELING MICROSCOPY OF CLEAVED SI AND GAAS-SURFACES IN AIR

被引：7

作者：

TANIMOTO, M

FURUTA, T

KURIYAMA, Y

机构：

来源：

JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS & EXPRESS LETTERS | 1989年 / 28卷 / 02期

关键词：

D O I：

10.1143/JJAP.28.L290

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：L290 / L292

页数：3

共 11 条

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