VALENCY AND STRUCTURE OF IRIDIUM IN ANODIC IRIDIUM OXIDE-FILMS

被引：86

作者：

HUPPAUFF, M ^{[1
]}

LENGELER, B ^{[1
]}

机构：

[1] FORSCHUNGSZENTRUM JULICH, INST SCHICHT & IONENTECH, W-5170 JULICH, GERMANY

来源：

JOURNAL OF THE ELECTROCHEMICAL SOCIETY | 1993年 / 140卷 / 03期

关键词：

D O I：

10.1149/1.2056127

中图分类号：

O646 [电化学、电解、磁化学];

学科分类号：

081704 ;

摘要：

The valence of iridium in anodic iridium oxide films has been determined by x-rav absorption spectroscopy and varies between 3.0 and 4.8 in a voltammogram cycle. When the valency v starts to increase the first coordination shell around an iridium ion begins to shrink from 0.203 at v = 3.0 to 0.191 nm at v = 4.8. At the same time a strong spread in the interatomic distances in this shell is observed. Our data give support to the model proposed by Kotz et al. for the charge exchange reaction during a voltammogram cycle.

引用

页码：598 / 602

页数：5

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