NEW CALCULATION OF ELECTRON SCATTERING CROSS SECTIONS AND A THEORETICAL DISCUSSION OF IMAGE CONTRAST IN ELECTRON MICROSCOPE

被引:91
作者
BURGE, RE
SMITH, GH
机构
来源
PROCEEDINGS OF THE PHYSICAL SOCIETY OF LONDON | 1962年 / 79卷 / 510期
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D O I
10.1088/0370-1328/79/4/301
中图分类号
O4 [物理学];
学科分类号
0702 ;
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页码:673 / &
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共 39 条
[1]  
Bohm D., 1951, QUANTUM THEORY
[2]   THE MEASUREMENT OF MASS, THICKNESS, AND DENSITY IN THE ELECTRON MICROSCOPE [J].
BURGE, RE ;
SILVESTER, NR .
JOURNAL OF BIOPHYSICAL AND BIOCHEMICAL CYTOLOGY, 1960, 8 (01) :1-11
[3]  
COMPTON AH, 1930, PHYS REV USA, V35, P928
[4]  
COSSLETT V E, 1958, J R Microsc Soc, V78, P18
[5]   FOURIER METHODS IN STRUCTURE ANALYSIS BY ELECTRON DIFFRACTION [J].
COWLEY, JM ;
REES, ALG .
REPORTS ON PROGRESS IN PHYSICS, 1958, 21 :165-225
[6]   ON AN ANALYTIC APPROXIMATION TO THE ATOMIC SCATTERING FACTOR [J].
FORSYTH, JB ;
WELLS, M .
ACTA CRYSTALLOGRAPHICA, 1959, 12 (05) :412-415
[7]  
HAEFER RA, 1960, OPTIK, V17, P213
[8]   DIFFERENTIAL SCATTERING CROSS-SECTION OF ATOMS TO MEDIUM ENERGY ELECTRONS AT SMALL ANGLES [J].
HAINE, ME ;
AGAR, AW .
BRITISH JOURNAL OF APPLIED PHYSICS, 1959, 10 (08) :341-347
[9]   CONTRAST ARISING FROM ELASTIC AND INELASTIC SCATTERING IN THE ELECTRON MICROSCOPE [J].
HAINE, ME .
JOURNAL OF SCIENTIFIC INSTRUMENTS, 1957, 34 (01) :9-15
[10]  
HAINE ME, 1961, ELECTRON MICROSCOPE