QUANTITATIVE ION PROBE MEASUREMENT USING MATRIX ION SPECIES RATIOS

[1] THERMODYNAMIC APPROACH TO QUANTITATIVE INTERPRETATION OF SPUTTERED ION MASS-SPECTRA [J]. ANALYTICAL CHEMISTRY, 1973, 45 (08) : 1421 - 1438

[2] QUANTITATION OF SECONDARY ION MASS-SPECTROMETRIC IMAGES BY MICRO-PHOTODENSITOMETRY AND DIGITAL IMAGE-PROCESSING [J]. ANALYTICAL CHEMISTRY, 1977, 49 (14) : 2322 - 2329

[3] QUANTITATIVE-ANALYSIS WITH AN ION MICROANALYZER [J]. ANALYTICAL CHEMISTRY, 1975, 47 (08) : 1294 - 1296

[4] LARSSON JJ, 1975, US JAPAN JOINT SEMIN

[5] MCHUGH JA, 1976, METHODS SURFACE ANAL

[6] QUANTITATIVE-ANALYSIS OF LOW-ALLOY STEELS BY SECONDARY ION MASS-SPECTROMETRY [J]. ANALYTICAL CHEMISTRY, 1976, 48 (04) : 699 - 708

[7] NEWBURY DE, 1976, SURFACE ANALYSIS TEC, P101

[8] SAMPLING ERROR IN ION MICROPROBE ANALYSIS [J]. ANALYTICAL CHEMISTRY, 1977, 49 (11) : 1529 - 1536

[9] EVALUATION OF LOCAL THERMAL-EQUILIBRIUM MODEL FOR QUANTITATIVE SECONDARY ION MASS-SPECTROMETRIC ANALYSIS [J]. ANALYTICAL CHEMISTRY, 1976, 48 (09) : 1341 - 1348

[1] THERMODYNAMIC APPROACH TO QUANTITATIVE INTERPRETATION OF SPUTTERED ION MASS-SPECTRA [J]. ANALYTICAL CHEMISTRY, 1973, 45 (08) : 1421 - 1438

[2] QUANTITATION OF SECONDARY ION MASS-SPECTROMETRIC IMAGES BY MICRO-PHOTODENSITOMETRY AND DIGITAL IMAGE-PROCESSING [J]. ANALYTICAL CHEMISTRY, 1977, 49 (14) : 2322 - 2329

[3] QUANTITATIVE-ANALYSIS WITH AN ION MICROANALYZER [J]. ANALYTICAL CHEMISTRY, 1975, 47 (08) : 1294 - 1296

[4] LARSSON JJ, 1975, US JAPAN JOINT SEMIN

[5] MCHUGH JA, 1976, METHODS SURFACE ANAL

[6] QUANTITATIVE-ANALYSIS OF LOW-ALLOY STEELS BY SECONDARY ION MASS-SPECTROMETRY [J]. ANALYTICAL CHEMISTRY, 1976, 48 (04) : 699 - 708

[7] NEWBURY DE, 1976, SURFACE ANALYSIS TEC, P101

[8] SAMPLING ERROR IN ION MICROPROBE ANALYSIS [J]. ANALYTICAL CHEMISTRY, 1977, 49 (11) : 1529 - 1536

[9] EVALUATION OF LOCAL THERMAL-EQUILIBRIUM MODEL FOR QUANTITATIVE SECONDARY ION MASS-SPECTROMETRIC ANALYSIS [J]. ANALYTICAL CHEMISTRY, 1976, 48 (09) : 1341 - 1348