IMMOBILIZATION OF PHOSPHOLIPIDS ON SILICON, PLATINUM, INDIUM TIN OXIDE AND GOLD SURFACES WITH CHARACTERIZATION BY X-RAY PHOTOELECTRON-SPECTROSCOPY AND TIME-OF-FLIGHT SECONDARY-ION MASS-SPECTROMETRY

被引：19

作者：

KALLURY, KMR

GHAEMMAGHAMI, V

KRULL, UJ

THOMPSON, M

DAVIES, MC

机构：

[1] UNIV TORONTO,DEPT CHEM,80 ST GEORGE ST,TORONTO M5S 1A1,ONTARIO,CANADA

[2] UNIV NOTTINGHAM,DEPT PHARMACEUT SCI,NOTTINGHAM NG7 2RD,ENGLAND

来源：

ANALYTICA CHIMICA ACTA | 1989年 / 225卷 / 02期

关键词：

D O I：

10.1016/S0003-2670(00)84626-7

中图分类号：

O65 [分析化学];

学科分类号：

070302 ; 081704 ;

摘要：

引用

页码：369 / 389

页数：21

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