X-RAY REFLECTION PROPERTIES OF ANNEALED SILICON SINGLE-CRYSTALS

被引：4

作者：

ZAUMSEIL, P

WINTER, U

JOKSCH, S

FREUND, AK

机构：

[1] DESY, HAMBURGER SYNCHROTRONSTRAHLUNGSLABOR, W-2000 HAMBURG 52, GERMANY

[2] EUROPEAN SYNCHROTRON RADIAT FACIL, F-38043 GRENOBLE, FRANCE

来源：

REVIEW OF SCIENTIFIC INSTRUMENTS | 1992年 / 63卷 / 01期

关键词：

D O I：

10.1063/1.1143775

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

We present a series of x-ray reflectivity measurements performed on annealed Czochralski grown silicon (ACS) crystals in the energy range E < 50 keV using sealed tube sources. To analyze the origin of the enhanced reflectivity of this material compared to perfect, FZ-grown silicon, double and triple crystal diffractometer measurements were carried out. The results are discussed with regard to the application of ACS for monochromatization of synchrotron radiation in the mentioned energy range.

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页码：907 / 910

页数：4

相关论文

共 12 条

[1]

FREUND AK, 1989, BASIC LIFE SCI, V51, P255

[2] SEPARATE MEASUREMENTS OF DYNAMICAL AND KINEMATICAL X-RAY DIFFRACTIONS FROM SILICON-CRYSTALS WITH A TRIPLE CRYSTAL DIFFRACTOMETER [J].

IIDA, A ;

KOHRA, K .

PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1979, 51 (02) :533-542

[3] HEATING EFFECTS OF MONOCHROMATOR CRYSTALS AT A HIGH-INTENSITY WIGGLER BEAM LINE [J].

JOKSCH, S ;

DEGENHARDT, D ;

FRAHM, R ;

MEYER, G .

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 1990, 291 (1-2) :325-331

[4] CHARACTERIZATION OF PROCESS-INDUCED DEFECTS IN SILICON WITH TRIPLE-CRYSTAL DIFFRACTOMETRY [J].

LOMOV, AA ;

ZAUMSEIL, P ;

WINTER, U .

ACTA CRYSTALLOGRAPHICA SECTION A, 1985, 41 (MAY) :223-227

[5] A NEUTRON BACKSCATTERING STUDY OF LATTICE DEFORMATIONS IN SILICON DUE TO SIO2 PRECIPITATION [J].

MAGERL, A ;

SCHNEIDER, JR ;

ZULEHNER, W .

JOURNAL OF APPLIED PHYSICS, 1990, 67 (01) :533-539

[6]

SCHMITZ JR, 1991, THESIS U DORTMUND

[7] TEST OF ANNEALED CZOCHRALSKI GROWN SILICON-CRYSTALS AS X-RAY-DIFFRACTION ELEMENTS WITH 145 KEV SYNCHROTRON RADIATION [J].

SCHNEIDER, JR ;

NAGASAWA, H ;

BERMAN, LE ;

HASTINGS, JB ;

SIDDONS, DP ;

ZULEHNER, W .

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 1989, 276 (03) :636-642

[8] ANNEALED CZOCHRALSKI GROWN SILICON-CRYSTALS - A NEW MATERIAL FOR THE MONOCHROMATIZATION OF SYNCHROTRON RADIATION AND X-RAYS ABOVE 60 KEV [J].

SCHNEIDER, JR ;

GONCALVES, OD ;

ROLLASON, AJ ;

BONSE, U ;

LAUER, J ;

ZULEHNER, W .

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1988, 29 (04) :661-674

[9] TRIPLE CRYSTAL DIFFRACTOMETER INVESTIGATIONS OF SILICON-CRYSTALS WITH DIFFERENT COLLIMATOR ANALYZER ARRANGEMENTS [J].

ZAUMSEIL, P ;

WINTER, U .

PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1982, 70 (02) :497-505

[10]

ZAUMSEIL P, UNPUB