OPTIMIZATION AND CHARACTERIZATION OF A DIFFERENTIAL PHOTOPYROELECTRIC SPECTROMETER

被引：8

作者：

CHRISTOFIDES, C ^{[1
]}

GHANDI, K ^{[1
]}

MANDELIS, A ^{[1
]}

机构：

[1] UNIV TORONTO, ONTARIO LASER & LIGHTWAVE RES CTR, TORONTO M5S 1A4, ONTARIO, CANADA

来源：

MEASUREMENT SCIENCE AND TECHNOLOGY | 1990年 / 1卷 / 12期

关键词：

D O I：

10.1088/0957-0233/1/12/019

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

A differential photopyroelectric (P2E) spectrometer using thin pyroelectric PVDF film, with real-time spectrum normalization measurement capability has been developed and characterized. The spectrometer is able to perform measurements as a function of wavelength (limited by the Xe lamp spectrum: 280-1960 nm) and modulation frequency (0.1-600 Hz). The authors describe the abilities and advantages of the photopyroelectric spectrometer over other photothermal spectroscopic instrumentation, and draw attention to different sources of possible experimental errors. Several experiments have been performed as a function of wavelength and/or modulation frequency in order to calibrate, characterize and optimize the working conditions of the photopyroelectric spectrometer. Some further measurements on c-Si have been performed in order to show the instrumentation capabilities. The present differential photopyroelectric spectroscopic technique seems to be very promising toward the characterization of semiconductor thin films and devices.

引用

页码：1363 / 1370

页数：8

共 23 条

[1]

ACKERMAN W, 1916, ANN PHYS, V46, P197

[2]

AMER NM, 1984, SEMICONDUCT SEMIMET, V21, P85

[3]

BEERMAN HP, 1967, AM CERAM SOC BULL, V46, P737

[4]

Bosquet P., 1971, SPECTROSCOPY ITS INS

[5]

CHRISTOFIDES C, 1990, IN PRESS REV SCI INS

[6]

Coufal H., 1987, Photoacoustic and thermal wave phenomena in semiconductors, P149

[7] PHOTOTHERMAL SPECTROSCOPY USING A PYROELECTRIC THIN-FILM DETECTOR [J].

COUFAL, H .

APPLIED PHYSICS LETTERS, 1984, 44 (01) :59-61

[8] PHOTOTHERMAL SPECTROSCOPY OF WEAKLY ABSORBING SAMPLES USING A THERMAL WAVE PHASE-SHIFTER [J].

COUFAL, H .

APPLIED PHYSICS LETTERS, 1984, 45 (05) :516-518

[9]

KIREV P, 1975, PHYSICS SEMICONDUCTO, pCH8

[10]

KYNAR, 1983, PIEZO FILM TECHNICAL

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