2-WAVELENGTH SCANNING SPOT INTERFEROMETER USING SINGLE-FREQUENCY DIODE-LASERS

被引：46

作者：

DENBOEF, AJ

机构：

来源：

APPLIED OPTICS | 1988年 / 27卷 / 02期

关键词：

D O I：

10.1364/AO.27.000306

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

引用

页码：306 / 311

页数：6

共 9 条

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[6] DIODE-LASER DIRECT MODULATION HETERODYNE INTERFEROMETER [J].

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[7]

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[8] ABSOLUTE STATISTICAL ERROR IN 2-WAVELENGTH ROUGH-SURFACE INTERFEROMETRY (ROSI) [J].

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