CHARACTERIZATION AND MODIFICATION OF CONDUCTING SUBSTRATES FOR ULTRATHIN ORGANIC FILMS BY SCANNING TUNNELING MICROSCOPY

被引：14

作者：

BUCHHOLZ, S

FUCHS, H

RABE, JP

机构：

[1] MAX PLANCK INST POLYMER RES,W-6500 MAINZ,GERMANY

[2] BASF AG,KUNSTSTOFFLAB,W-6700 LUDWIGSHAFEN,GERMANY

来源：

ADVANCED MATERIALS | 1991年 / 3卷 / 01期

关键词：

D O I：

10.1002/adma.19910030110

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

Communication: The structure of an organic film of molecular thickness depends strongly on the surface properties of the underlying substrate. STM is a method which enables a substrate surface to be characterized and controlled as demonstrated in the figure, where the letter “U” etched with an STM tip into a highly oriented pyrolytic graphite (HOPG) surface is shown. The holes, which are around 5 nm in diameter, could serve as nucleation sites for an organic adsorbate phase. (Figure Presented.) Copyright © 1991 Verlag GmbH & Co. KGaA, Weinheim

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页码：51 / 54

页数：4

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