COMPTON PROFILES OF TRIGONAL AND AMORPHOUS SELENIUM

被引：13

作者：

BONSE, U ^{[1
]}

SCHRODER, W ^{[1
]}

SCHULKE, W ^{[1
]}

机构：

[1] UNIV DORTMUND,INST PHYS,D-4600 DORTMUND 50,FED REP GER

来源：

SOLID STATE COMMUNICATIONS | 1977年 / 21卷 / 08期

关键词：

D O I：

10.1016/0038-1098(77)91158-9

中图分类号：

O469 [凝聚态物理学];

学科分类号：

070205 ;

摘要：

引用

页码：807 / 809

页数：3

共 11 条

[1]

BONSE U, TO BE PUBLISHED

[2] COMPTON SCATTERING AND ELECTRON MOMENTUM DISTRIBUTIONS [J].

COOPER, M .

ADVANCES IN PHYSICS, 1971, 20 (86) :453-&

[3]

JOHANNOPOULOS JD, 1975, PHYS REV B, V11, P2186

[4]

KRUSIUS P, TO BE PUBLISHED

[5] DOUBLE SCATTERING IN COMPTON PROFILE MEASUREMENTS - ANALYTIC APPROACH [J].

PAATERO, P ;

HALONEN, V .

NUCLEAR INSTRUMENTS & METHODS, 1976, 135 (03) :537-539

[6] ELECTRON MOMENTUM DISTRIBUTIONS IN GRAPHITE AND DIAMOND AND CARBON-CARBON BONDING [J].

REED, WA ;

EISENBERGER, P ;

PANDEY, KC ;

SNYDER, LC .

PHYSICAL REVIEW B, 1974, 10 (04) :1507-1515

[7] GENERAL METHOD OF TREATING INSTRUMENTAL DISTORTION OF SPECTRAL DATA WITH APPLICATIONS TO X-RAY PHYSICS [J].

SAUDER, WC .

JOURNAL OF APPLIED PHYSICS, 1966, 37 (04) :1495-&

[8] APPLICATION OF SPLINE FUNCTIONS TO CORRECTION OF RESOLUTION ERRORS IN SMALL-ANGLE SCATTERING [J].

SCHELTEN, J ;

HOSSFELD, F .

JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1971, 4 (JUN1) :210-&

[9] VALENCE BAND DENSITY OF STATES OF AMORPHOUS AND TRIGONAL SELENIUM DETERMINED BY X-RAY AND UV PHOTOEMISSION [J].

SHEVCHIK, NJ ;

TEJEDA, J ;

CARDONA, M ;

LANGER, DW .

SOLID STATE COMMUNICATIONS, 1973, 12 (12) :1285-1288

[10] X-RAY AND FAR-UV PHOTOEMISSION FROM AMORPHOUS AND CRYSTALLINE FILMS OF SE AND TE [J].

SHEVCHIK, NJ ;

CARDONA, M ;

TEJEDA, J .

PHYSICAL REVIEW B, 1973, 8 (06) :2833-2841

← 1 2 →