CARRIER DOPING THROUGH THE HALOGEN INTERCALATION INTO THE BI-2212, BI-2223 AND BI-2222 PHASES

被引：2

作者：

KOIKE, Y

SASAKI, K

HISAKI, T

FUJIWARA, A

KATO, M

NOJI, T

SAITO, Y

机构：

[1] Department of Applied Physics, Faculty of Engineering, Tohoku University, Sendai

来源：

PHYSICA C | 1994年 / 235卷

关键词：

D O I：

10.1016/0921-4534(94)91934-8

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

The variations with x of T-c, thermoelectric power and magnetic susceptibility have been investigated for iodine-intercalated Bi2Sr2CaCu2O8+deltaIx with 0 less than or equal to x less than or equal to 1, using sintered samples of Bi2Sr2CaCu2O8+delta with three different values of delta for the host samples. It has been concluded that the strange x dependence of T-c is due to the x dependence of the hole concentration p in the CuO2 sheets, owing to charge transfer from iodine to the CuO2 sheets, and that the value of p has an upper limit. The effects of halogen intercalation on T-c for the Bi-2223 and 2222 phases are also described.

引用

页码：1419 / 1420

页数：2

共 7 条

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