A MIRROR ELECTRON-MICROSCOPE FOR SURFACE-ANALYSIS

被引：15

作者：

FOSTER, MS ^{[1
]}

CAMPUZANO, JC ^{[1
]}

WILLIS, RF ^{[1
]}

DUPUY, JC ^{[1
]}

机构：

[1] INST NATL SCI APPL LYON,F-69621 VILLEURBANNE,FRANCE

来源：

JOURNAL OF MICROSCOPY-OXFORD | 1985年 / 140卷

关键词：

D O I：

10.1111/j.1365-2818.1985.tb02692.x

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

引用

页码：395 / 403

页数：9

共 18 条

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