ACCURATE AND EFFICIENT TESTING OF THE EXPONENTIAL AND LOGARITHM FUNCTIONS

被引：3

作者：

TANG, PTP

机构：

来源：

ACM TRANSACTIONS ON MATHEMATICAL SOFTWARE | 1990年 / 16卷 / 03期

关键词：

ADA EXPONENTIAL FUNCTION; LOGARITHM FUNCTION; TESTING;

D O I：

10.1145/79505.79506

中图分类号：

TP31 [计算机软件];

学科分类号：

081202 ; 0835 ;

摘要：

Table-driven techniques can be used to test highly accurate implementations of EXP and LOG. The largest error observed in EXP and LOG accurately to within 1/500 unit in the last place are reported in our tests. Methods to verify the tests' reliability are discussed. Results of applying the tests to our own as well as to a number of other implementations of EXP and LOG are presented.

引用

页码：185 / 200

页数：16

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