SCATTERING FROM DIELECTRIC MIRRORS

被引:8
作者
GLOGE, D
CHINNOCK, EL
EARL, HE
机构
来源
BELL SYSTEM TECHNICAL JOURNAL | 1969年 / 48卷 / 03期
关键词
D O I
10.1002/j.1538-7305.1969.tb01127.x
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Most of the light scattered from high‐reflectivity dielectric mirrors is radiated into directions close to the reflected beam. We measured the angular power distribution at angles between 0.01° and 1° from the beam axis by scanning with a narrow slit. From this a linear structure junction is calculated for coherence lengths betweeen 20 microns and 1 millimeter, assuming isotropic surface statistics. The corresponding power density decreases with the third power of the scattering angle. The power outside a given radius and the power density is plotted for various wavelengths and distances. © 1969 The Bell System Technical Journal
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收藏
页码:511 / +
相关论文
共 5 条
[1]  
BEATEY R, 1967, APPL OPTICS, V6, P831
[2]  
Beckmann P., 1963, SCATTERING ELECTROMA
[3]   CAPACITY OF MULTIPLE BEAM WAVEGUIDES AND OPTICAL DELAY LINES [J].
GLOGE, D ;
WEINER, D .
BELL SYSTEM TECHNICAL JOURNAL, 1968, 47 (10) :2095-+
[4]   USE OF SCANNING SLITS FOR OBTAINING THE CURRENT DISTRIBUTION IN ELECTRON BEAMS [J].
HARKER, KJ .
JOURNAL OF APPLIED PHYSICS, 1957, 28 (11) :1354-1357
[5]  
ONEILL EL, 1963, INTRODUCTION STATIST, P100