STYLUS TRACER RESOLUTION AND SURFACE DAMAGE AS DETERMINED BY SCANNING ELECTRON-MICROSCOPY

被引:8
作者
GUERRERO, JL
BLACK, JT
机构
来源
JOURNAL OF ENGINEERING FOR INDUSTRY | 1972年 / 94卷 / 04期
关键词
D O I
10.1115/1.3428308
中图分类号
T [工业技术];
学科分类号
08 ;
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页码:1087 / &
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