ELECTRON-IMPACT IONIZATION CROSS-SECTION OF NEON (SIGMA(N+), N=1-5)

被引：41

作者：

ALMEIDA, DP

FONTES, AC

GODINHO, CFL

机构：

[1] Espectrómetro de Massa por Cotisüo Eletrónica, Instituto de Física, Universidade Federal do Rio de Janeiro, Rio de Janeiro

来源：

JOURNAL OF PHYSICS B-ATOMIC MOLECULAR AND OPTICAL PHYSICS | 1995年 / 28卷 / 15期

关键词：

D O I：

10.1088/0953-4075/28/15/022

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

Multiple ionization cross sections of neon (Ne-Ne-n+, with n = 1-5) by electron impact have been measured with energies ranging from threshold up to 3000 eV, by a time-of-flight technique. A comparison with other experimental data is presented. The integrated oscillator strengths (M(n+)(2)) for the processes have been determined showing a good agreement with previous reported data.

引用

页码：3335 / 3345

页数：11

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