A NEW BESSEL-BOX ENERGY ANALYZER FOR SPUTTERED NEUTRAL MASS-SPECTROMETRY

被引:6
作者
YOSHIKAWA, H
SHIMIZU, R
机构
[1] Department of Applied Physics, Osaka University, Osaka, 565, Suita-shi
来源
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS | 1990年 / 29卷 / 02期
关键词
AI-Mg alloy; Bessel-Box energy analyzer; SNMS; Space-charge effect;
D O I
10.1143/JJAP.29.386
中图分类号
O59 [应用物理学];
学科分类号
摘要
A new type energy analyzer with an electron impact ionizer for sputtered neutral mass spectrometry (SNMS), which is compact enough to be mounted in secondary ion mass spectrometry (SIMS) instruments, has been developed. The compact energy analyzer, called a modified Bessel-Box, enables energy distribution of slow charged particles with different energy resolutions to be obtained by changing the ratio of voltages applied to the analyzer. Applying this system for SNMS of Al-Mg alloy under different partial pressures of oxygen, it has been confirmed that SNMS is free from oxygen enhancement, allowing the quantification of matrix elements with considerable accuracy. It has also been revealed that the space-charge effect caused by bombarding electrons becomes fairly marked, resulting in the deformation and shift of energy distributions of the postionized particles. © 1990 The Japan Society of Applied Physics.
引用
收藏
页码:386 / 391
页数:6
相关论文
共 34 条
[1]   ANOMALOUS MASS NUMBERS IN QUADRUPOLE MASS SPECTROMETERS (QMS) AT VERY LOW-PRESSURES [J].
ADRADOS, JP ;
DESEGOVIA, JL .
VACUUM, 1984, 34 (8-9) :737-741
[2]   NEW ELECTRON SPECTROMETER DESIGN .2. [J].
ALLEN, JD ;
DURHAM, JD ;
SCHWEITZER, GK ;
DEEDS, WE .
JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 1976, 8 (05) :395-410
[3]   QUADRUPOLE GAS ANALYZERS [J].
BATEY, JH .
VACUUM, 1987, 37 (8-9) :659-668
[4]   ON THE USE OF NONRESONANT MULTIPHOTON IONIZATION OF DESORBED SPECIES FOR SURFACE-ANALYSIS [J].
BECKER, CH .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1987, 5 (04) :1181-1185
[5]   SECONDARY ION YIELDS NEAR 1 FOR SOME CHEMICAL COMPOUNDS [J].
BENNINGHOVEN, A ;
MUELLER, A .
PHYSICS LETTERS A, 1972, A-40 (02) :169-+
[6]  
BESKE HE, 1962, Z ANGEW PHYS, V14, P30
[7]   ADSORPTION OF GASES STUDIED BY SECONDARY ION EMISSION MASS-SPECTROMETRY [J].
BLAISE, G ;
BERNHEIM, M .
SURFACE SCIENCE, 1975, 47 (01) :324-343
[8]   COMPARATIVE EFFECTS OF OXYGEN ON ION EMISSION AND SURFACE POTENTIAL OF METALS [J].
BLAISE, G ;
SLODZIAN, G .
SURFACE SCIENCE, 1973, 40 (03) :708-714
[9]  
FITE WL, 1836, Patent No. 769696
[10]  
GERHARD W, 1983, Z PHYS B, V54, P71