ESCAPE PEAKS AND INTERNAL FLUORESCENCE IN X-RAY-SPECTRA RECORDED WITH LITHIUM DRIFTED SILICON DETECTORS

被引：82

作者：

REED, SJB

WARE, NG

机构：

来源：

JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS | 1972年 / 5卷 / 06期

关键词：

D O I：

10.1088/0022-3735/5/6/029

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：582 / &

共 7 条

[1] AITKEN DW, 1971, ASTMSTP485, P36
[2] [Anonymous], ELECT MICROPROBE
[3] ATOMIC FLUORESCENCE YIELDS
FINK, RW
JOPSON, RC
MARK, H
SWIFT, CD
[J]. REVIEWS OF MODERN PHYSICS, 1966, 38 (03) : 513 - &
[4] CALCULATION OF ESCAPE PEAK FOR GE-LI AND NAI RADIATION DETECTORS
FIORATTI, MP
PIERMATTEI, SR
[J]. NUCLEAR INSTRUMENTS & METHODS, 1971, 96 (04): : 605 - +
[5] JOHNSON GG, 1970, DS46 ASTM DAT SER
[6] HIGH RESOLUTION SPECTROMETRY WITH NUCLEAR RADIATION DETECTORS
KANDIAH, K
[J]. NUCLEAR INSTRUMENTS & METHODS, 1971, 95 (02): : 289 - &
[7] SI(LI) SPECTROMETERS FOR ELECTRONS AND LOW-ENERGY PHOTONS
WOOD, RE
RAO, PV
PUCKETT, OH
PALMS, JM
[J]. NUCLEAR INSTRUMENTS & METHODS, 1971, 94 (02): : 245 - &